Summary
Amorphous carbon movies have been deposited by thermal evaporation of bulk samples of various shungites and graphite. Structural properties and the dimensions of carbon nanoclusters within the movies have been decided from the evaluation of their chosen space electron diffraction (SAED) patterns and Raman spectra. To investigate the attainable distribution of hint parts within the movies, aspect mapping was carried out utilizing scanning electron microscopy. {The electrical} conductivity of the obtained movies was measured at temperatures starting from the liquid nitrogen to room temperature. The measurements confirmed variations in the kind of dependence {of electrical} conductivity on temperature for various nano-crystalline movies from monotonic, typical for semiconductors to advanced, V-shaped curve containing sections of the metallic and semiconductor sorts.
